Acta Physica Slovaca vol. 48 , no. 4 (1998)
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V. Gašparík, M. Ožvold
Optical properties of -FeSi2 semiconducting layers
Acta Physica Slovaca vol. 48, no. 4, 417 (1998)
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Jergel M., Majková E., Luby S., Senderák R., Holý V.
Characterization of surfaces and interfaces by hard X-ray reflectometry and diffuse scattering at grazing incidence
Acta Physica Slovaca vol. 48, no. 4, 427 (1998)
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Lohner T., Khánh N.Q., Zolnai Zs
Spectroellipsometric characterization of ion implanted semiconductors and porous silicon
Acta Physica Slovaca vol. 48, no. 4, 441 (1998)
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Franta D., Ohlídal I., Munzar D
Parametrisation of the model of dispersion dependences of solid state optical constants
Acta Physica Slovaca vol. 48, no. 4, 451 (1998)
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Ohlídal I., Franta D.
Ellipsometry of thin films
Acta Physica Slovaca vol. 48, no. 4, 459 (1998)
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